MOIP500P SigOFIT Optical Isolated Probe

The MOIP500P is a high-performance fiber optic isolated probe from Micsig's Gen 3 SigOFIT product line, engineered for precision differential signal measurement and floating voltage measurement in medium-to-high bandwidth power electronics applications. Built on patented SigOFIT patented technology, this Micsig Gen 3 probe delivers 500MHz bandwidth with 800ps maximum rise time, enabling accurate capture of fast switching transients in gallium nitride testing and silicon carbide testing scenarios. Featuring exceptional common mode noise rejection with 180dB DC common mode rejection and maintaining 114dB CMRR at 500MHz, the MOIP500P provides complete electrical isolation with effective oscillation suppression for high-frequency power converter designs. With an ultra-low 0.3mVrms maximum noise floor and 1 percent DC gain accuracy, this probe delivers precision ultra low noise measurement performance with 0.1 percent zero drift for reliable long term measurement stability. The 85kVpk isolation voltage rating delivers robust high voltage isolation for high voltage safety testing and high-voltage power system applications. The 1pF input capacitance with short coaxial test leads minimizes circuit loading, making the probe suitable for safe IGBT device testing and high-speed power semiconductor evaluation without disturbing the device under test. Wide measurement flexibility from 0.01V minimum measurement range to 20kV maximum input voltage is achieved through multi attenuator support with interchangeable attenuator tips, covering everything from low-level signal analysis to ultra-high-voltage power measurements. The dual gain range switching capability between 0dB and 20dB further optimizes signal-to-noise ratio within each measurement range. Built-in optical power compensation ensures continuous high-fidelity waveform output in demanding 24/7 measurement environments, paired with auto calibration function for immediate measurement readiness upon power-up. With 2 meter optical fiber length, 12V DC power supply, and standard BNC interface, the MOIP500P integrates seamlessly into existing test benches for motor drive testing, power converter design, switching power supply test, inverter circuit testing, uninterruptible power supply test, power semiconductor evaluation, shunt current measurement, electromagnetic interference test, and electrostatic discharge testing applications. Superior electromagnetic immunity and high frequency interference rejection make this probe an excellent reference standard for signal accuracy verification and characterizing wide-bandgap semiconductor devices at medium bandwidths.

Key Features

• 500MHz High Bandwidth: 800ps rise time for capturing fast switching transients in GaN, SiC, and IGBT power device testing.
• Exceptional CMRR Performance: 180dB at DC and 114dB at 500MHz common mode rejection for clean floating measurements at high frequencies.
• 85kV Full Isolation: 85kVpk isolation voltage provides complete galvanic isolation for high-voltage safety testing applications.
• Ultra-Low Noise Design: 0.3mVrms maximum noise with 1% DC gain accuracy and 0.1% zero drift for precision measurement.
• Wide Dynamic Range: Interchangeable attenuators support 0.01V to 20kV differential signals with 0dB/20dB dual gain switching.
• Low Input Capacitance: 1pF input capacitance with coaxial leads minimizes circuit loading for safe high-speed device testing.
• Stable Calibration-Free: Optical power compensation and automatic calibration ensure continuous stable measurements.
• Versatile Applications: Ideal for motor drives, power converters, inverters, UPS, current shunts, and EMI/ESD testing.