MOIP1000P SigOFIT Gen 3 Optical Isolated Probe

The MOIP1000P is Micsig's flagship SigOFIT Gen 3 probe, representing the highest-performance optical isolated probe in the SigOFIT product family with industry-leading common mode rejection and signal fidelity. Built on exclusive SigOFIT technology, this Micsig fiber optic probe delivers 1GHz bandwidth with 450ps maximum rise time, enabling ultra-fast differential voltage measurement and floating measurement for cutting-edge power semiconductor applications. As the ultimate reference probe for signal fidelity verification, the MOIP1000P achieves an exceptional 180dB DC CMRR and maintains 108dB CMRR at 1GHz, effectively suppressing common mode noise oscillation even at the highest switching frequencies. With an ultra-low 0.3mVrms noise floor and 1 percent DC gain accuracy, this probe delivers precision low noise signal measurement with 0.1 percent zero drift for reliable long-duration testing. The 85kVpk common mode voltage rating provides a complete electrical isolation solution for high voltage isolation testing and high voltage safety test applications. Featuring 1pF minimum input capacitance and short test leads with coaxial transmission, the probe is optimized for safe GaN device testing, SiC device testing, and IGBT testing without circuit loading concerns. Versatile measurement range from 0.01V minimum measurement voltage to 20kV maximum measurement voltage is achieved through interchangeable attenuator tips, making this attenuator compatible probe suitable for everything from small-signal analysis to ultra-high-voltage power testing. The 0dB 20dB switching capability further optimizes signal-to-noise ratio within each range. Real-time optical power compensation ensures continuous high-fidelity waveform output in complex 24/7 measurement environments, paired with automatic calibration for ready-to-measure performance upon power-up. With 2 meter fiber cable length, DC 12V power supply, and universal BNC interface, the MOIP1000P integrates seamlessly into existing test setups for motor drive design, power converter testing, switching power supply testing, inverter design testing, UPS testing, power device evaluation, current shunt measurement, EMI troubleshooting, and ESD troubleshooting applications. Superior electromagnetic interference immunity and gain stability improvement make this probe the gold standard for verifying the accuracy of other voltage probes and characterizing next-generation wide-bandgap semiconductor devices.

Key Features

• 1GHz Ultra-Wide Bandwidth: 450ps rise time for capturing the fastest switching transients in GaN and SiC power device testing.
• Industry-Leading CMRR: 180dB at DC and 108dB at 1GHz common mode rejection for clean floating measurements at high frequencies.
• 85kV Complete Isolation: 85kVpk common mode voltage rating provides full galvanic isolation for high-voltage safety testing.
• Ultra-Low Noise Performance: 0.3mVrms noise floor with 1% DC gain accuracy and 0.1% zero drift for precision measurement.
• Wide Measurement Range: Interchangeable attenuators support 0.01V to 20kV differential signals with 0dB/20dB gain switching.
• Minimal Input Capacitance: 1pF minimum input capacitance with coaxial leads for safe testing of fast-switching GaN devices.
• Calibration-Free Operation: Real-time optical power compensation and automatic calibration for instant, stable measurements.
• Broad Application Scope: Ideal for motor drives, power converters, inverters, UPS, current shunts, and EMI/ESD troubleshooting.